{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:23:37Z","timestamp":1729628617171,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/isqed.2009.4810288","type":"proceedings-article","created":{"date-parts":[[2009,4,3]],"date-time":"2009-04-03T18:50:11Z","timestamp":1238784611000},"page":"167-171","source":"Crossref","is-referenced-by-count":4,"title":["On-chip transistor characterization arrays with digital interfaces for variability characterization"],"prefix":"10.1109","author":[{"given":"Simeon","family":"Realov","sequence":"first","affiliation":[]},{"given":"William","family":"McLaughlin","sequence":"additional","affiliation":[]},{"given":"K. L.","family":"Shepard","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"69","author":"pang","year":"2006","journal-title":"VLSI circuits"},{"key":"2","first-page":"281","author":"drego","year":"2007","journal-title":"ISQED"},{"key":"1","first-page":"368","author":"nassif","year":"2000","journal-title":"ISSCC"},{"key":"7","first-page":"1433","volume":"24","author":"pelgrom","year":"1989","journal-title":"JSSC"},{"key":"6","first-page":"154","volume":"27","author":"michael","year":"1992","journal-title":"JSSC"},{"key":"5","doi-asserted-by":"crossref","first-page":"806","DOI":"10.1049\/el:20070017","volume":"43","author":"wang","year":"2007","journal-title":"Elect Lett"},{"key":"4","first-page":"67","author":"agarwal","year":"2006","journal-title":"VLSI circuits"}],"event":{"name":"2009 10th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2009,3,16]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2009,3,18]]}},"container-title":["2009 10th International Symposium on Quality of Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4804412\/4810250\/04810288.pdf?arnumber=4810288","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T18:34:32Z","timestamp":1497810872000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4810288\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/isqed.2009.4810288","relation":{},"subject":[],"published":{"date-parts":[[2009,3]]}}}