{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T11:45:46Z","timestamp":1725450346645},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/isqed.2009.4810341","type":"proceedings-article","created":{"date-parts":[[2009,4,3]],"date-time":"2009-04-03T14:50:11Z","timestamp":1238770211000},"page":"476-481","source":"Crossref","is-referenced-by-count":2,"title":["Optimization strategies to improve statistical timing"],"prefix":"10.1109","author":[{"given":"Parimala","family":"Viswanath","sequence":"first","affiliation":[]},{"given":"Pranav","family":"Murthy","sequence":"additional","affiliation":[]},{"given":"Debajit","family":"Das","sequence":"additional","affiliation":[]},{"given":"R.","family":"Venkatraman","sequence":"additional","affiliation":[]},{"given":"Ajoy","family":"Mandal","sequence":"additional","affiliation":[]},{"given":"Arvind","family":"Veeravalli","sequence":"additional","affiliation":[]},{"family":"Udayakumar H","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.850834"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159781"},{"journal-title":"Timing (Information Technology Transmission Processing and Storage)","year":"0","author":"sapatnekar","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.34"},{"year":"0","key":"7"},{"year":"0","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065607"},{"key":"4","first-page":"331","article-title":"First-order incremental block-based statistical timing analysis","author":"visweswariah","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"journal-title":"Statistical Analysis and Optimization for VLSI Timing and Power","year":"0","author":"srivastava","key":"9"},{"year":"0","key":"8"}],"event":{"name":"2009 10th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2009,3,16]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2009,3,18]]}},"container-title":["2009 10th International Symposium on Quality of Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4804412\/4810250\/04810341.pdf?arnumber=4810341","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T15:39:48Z","timestamp":1489765188000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4810341\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/isqed.2009.4810341","relation":{},"subject":[],"published":{"date-parts":[[2009,3]]}}}