{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:23:05Z","timestamp":1725538985099},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/isqed.2009.4810379","type":"proceedings-article","created":{"date-parts":[[2009,4,3]],"date-time":"2009-04-03T18:50:11Z","timestamp":1238784611000},"page":"702-707","source":"Crossref","is-referenced-by-count":0,"title":["Simultaneous test pattern compaction, ordering and X-filling for testing power reduction"],"prefix":"10.1109","author":[{"family":"Ju-Yueh Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yu Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rupak","family":"Majumdar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Lei He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.101"},{"year":"0","key":"22"},{"journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"17"},{"year":"0","key":"23"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.16"},{"key":"15","article-title":"power reduction in bist by exploiting don't cares in test patterns","author":"costa","year":"0","journal-title":"IEEE IWLS 1998"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364519"},{"key":"13","article-title":"a new atpg method for efficient capture power reduction during scan testing","author":"wen","year":"2006","journal-title":"Proceedings of the 20th IEEE VLSI Test Symposium"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011128"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/43.736572"},{"key":"12","first-page":"265","article-title":"on low-capture-power test generation for scan testing","author":"wen","year":"2005","journal-title":"Proc of IEEE 23th VLSI Test Symposium"},{"year":"0","key":"21"},{"key":"3","article-title":"the need to address power during manufacturing test","author":"uzzaman","year":"2008","journal-title":"EDA DesignLine"},{"key":"20","article-title":"effective preprocessing in sat through variable and clause elimination","author":"een","year":"0","journal-title":"SAT 2005"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003802"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1998.706917"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437660"},{"key":"6","first-page":"1184","article-title":"ifill: an impact-oriented x-filling method for shift- and capture-power reduction in at-speed scan-based testing","author":"li","year":"2008","journal-title":"Design Automation and Test in Europe"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4484032"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297694"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843824"},{"year":"0","key":"8"}],"event":{"name":"2009 10th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2009,3,16]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2009,3,18]]}},"container-title":["2009 10th International Symposium on Quality of Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4804412\/4810250\/04810379.pdf?arnumber=4810379","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T18:37:00Z","timestamp":1489775820000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4810379\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/isqed.2009.4810379","relation":{},"subject":[],"published":{"date-parts":[[2009,3]]}}}