{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T13:00:21Z","timestamp":1773838821005,"version":"3.50.1"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450396","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T13:45:07Z","timestamp":1271771107000},"page":"87-91","source":"Crossref","is-referenced-by-count":3,"title":["BSIM4-based lateral diode model for LNA co-designed with ESD protection circuit"],"prefix":"10.1109","author":[{"family":"Ming-Ta Yang","sequence":"first","affiliation":[]},{"family":"Yang Du","sequence":"additional","affiliation":[]},{"given":"Charles","family":"Teng","sequence":"additional","affiliation":[]},{"given":"Tony","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Eugene","family":"Worley","sequence":"additional","affiliation":[]},{"given":"Ken","family":"Liao","sequence":"additional","affiliation":[]},{"family":"You-Wen Yau","sequence":"additional","affiliation":[]},{"given":"Geoffrey","family":"Yeap","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"67","article-title":"A Physics-based model for ESD protection diodes under very fast Transients","author":"manouvrier","year":"2008","journal-title":"2008 IEEE EOS\/ESD Symp Dig"},{"key":"ref3","first-page":"14","article-title":"On the relevance of IC ESD performance to product quality","author":"smedes","year":"2008","journal-title":"2008 IEEE EOS\/ESD Symp Dig"},{"key":"ref6","year":"0","journal-title":"Foundry document"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.853642"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2007.4401748"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568713"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2000.890084"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.933455"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","location":"San Jose, CA, USA","start":{"date-parts":[[2010,3,22]]},"end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450396.pdf?arnumber=5450396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T20:06:11Z","timestamp":1489867571000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450396\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450396","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}