{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T10:18:10Z","timestamp":1725445090641},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450446","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T09:45:07Z","timestamp":1271756707000},"page":"320-326","source":"Crossref","is-referenced-by-count":0,"title":["Accurate multi-specification DPPM estimation using layered sampling based simulation"],"prefix":"10.1109","author":[{"given":"Ender","family":"Yilmaz","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2016136"},{"key":"ref3","first-page":"69","article-title":"Mixture importance sampling and its application to the analysis of sram designs in the presence of rare failure events","author":"kanj","year":"2006","journal-title":"IEEE Design Automation Conference"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/4.982424"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASIC.2002.1158094"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/82.728852"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/4.859508"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-005-6361-9"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1988.10488434"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1080\/00207547808930043"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810755"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/00207540110095709"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.30"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2010,3,22]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450446.pdf?arnumber=5450446","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T15:58:41Z","timestamp":1489852721000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450446\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450446","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}