{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T15:59:29Z","timestamp":1761580769608,"version":"3.37.3"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450504","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T13:45:07Z","timestamp":1271771107000},"page":"660-666","source":"Crossref","is-referenced-by-count":20,"title":["Signal probability control for relieving NBTI in SRAM cells"],"prefix":"10.1109","author":[{"given":"Yuji","family":"Kunitake","sequence":"first","affiliation":[]},{"given":"Toshinori","family":"Sato","sequence":"additional","affiliation":[]},{"given":"Hiroto","family":"Yasuura","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.852523"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/859618.859620"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.1897075"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.2198826"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197745"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.5194\/ars-7-191-2009"},{"journal-title":"Media Embedded Processor","year":"0","key":"ref5"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"726","DOI":"10.1109\/ASPDAC.2008.4484047","article-title":"Nbti induced performance degradation in logic and memory circuits: How effectively can we approach a reliability solution?","author":"kang","year":"2008","journal-title":"In Asia and South Pacific Design Automation Conference"},{"journal-title":"Predictive techinology model","year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.11"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.73"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2010,3,22]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450504.pdf?arnumber=5450504","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,20]],"date-time":"2025-02-20T02:37:29Z","timestamp":1740019049000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450504\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450504","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}