{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,19]],"date-time":"2025-10-19T18:20:13Z","timestamp":1760898013979},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450507","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T13:45:07Z","timestamp":1271771107000},"page":"638-645","source":"Crossref","is-referenced-by-count":3,"title":["Scalable methods for the analysis and optimization of gate oxide breakdown"],"prefix":"10.1109","author":[{"family":"Jianxin Fang","sequence":"first","affiliation":[]},{"given":"Sachin S.","family":"Sapatnekar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/16.987123"},{"year":"0","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.248073"},{"year":"0","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910444"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2003.809447"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251187"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/7298.974832"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.917334"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681653"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.462.0287"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946459"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/16.987123"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2010,3,22]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450507.pdf?arnumber=5450507","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T19:59:21Z","timestamp":1489867161000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450507\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450507","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}