{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T22:04:26Z","timestamp":1773093866303,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450515","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T13:45:07Z","timestamp":1271771107000},"page":"611-617","source":"Crossref","is-referenced-by-count":56,"title":["Dynamic voltage (IR) drop analysis and design closure: Issues and challenges"],"prefix":"10.1109","author":[{"given":"S K","family":"Nithin","sequence":"first","affiliation":[]},{"given":"Gowrysankar","family":"Shanmugam","sequence":"additional","affiliation":[]},{"given":"Sreeram","family":"Chandrasekar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Hierarchical power distribution and power management scheme for a single chip mobile processor","author":"hattori","year":"0","journal-title":"Design Automation Conference 2006 43rd ACM\/IEEE"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.79"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597223"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VLSISOC.2007.4402515"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/344166.344181","article-title":"Design issues for dynamic voltage scaling","author":"burd","year":"2000","journal-title":"international Symposium on Low Power Electronics and Design Proceedings of the 2000 international symposium on Low power electronics and design"},{"key":"ref4","year":"2007","journal-title":"The International Technology Roadmap for Semiconductors"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2008.4479725"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.1999.759726"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2009.45"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1109\/TEST.2007.4437661","article-title":"Case study of a low power MTCMOS based ARM926 SoC: Design, analysis and test challenges","author":"idgunji","year":"2007","journal-title":"Test Conference 2007 ITC 2007 IEEE International"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.894414"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"787","DOI":"10.1145\/74382.74530","article-title":"optimum design of reliable ic power networks having general graph topologies","author":"chowdhury","year":"1989","journal-title":"26th ACM\/IEEE Design Automation Conference"},{"key":"ref1","first-page":"651","article-title":"Challenges in power-ground integrity","author":"lin","year":"2001","journal-title":"International Conference on Computer Aided Design"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751912"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","location":"San Jose, CA, USA","start":{"date-parts":[[2010,3,22]]},"end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450515.pdf?arnumber=5450515","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T10:00:33Z","timestamp":1635242433000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450515\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450515","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}