{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:23:52Z","timestamp":1725413032708},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450517","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T09:45:07Z","timestamp":1271756707000},"page":"582-589","source":"Crossref","is-referenced-by-count":0,"title":["Case studies of mixed-signal DFT"],"prefix":"10.1109","author":[{"given":"Ramyanshu","family":"Datta","sequence":"first","affiliation":[]},{"given":"Mahit","family":"Warhadpande","sequence":"additional","affiliation":[]},{"given":"Dale","family":"Heaton","sequence":"additional","affiliation":[]},{"given":"S","family":"Aarthi","sequence":"additional","affiliation":[]},{"given":"Ram","family":"Jonnavithula","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470623"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386972"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470621"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1119772.1119919"},{"journal-title":"Test and Test Equipment","year":"2007","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.53"},{"article-title":"An introduction to mixed signal IC test and measurement","year":"2001","author":"burns","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529862"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2010,3,22]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450517.pdf?arnumber=5450517","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T16:03:45Z","timestamp":1489853025000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450517\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450517","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}