{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:11:58Z","timestamp":1747807918117},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450543","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T09:45:07Z","timestamp":1271756707000},"page":"406-412","source":"Crossref","is-referenced-by-count":10,"title":["A comprehensive model for gate delay under process variation and different driving and loading conditions"],"prefix":"10.1109","author":[{"given":"Mingzhi","family":"Gao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Zuochang Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yao Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yan Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Zhiping Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Projection - based performance modeling for inter\/intra-die variations","author":"li","year":"2005","journal-title":"ICCAD"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159782"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IWPSD.2007.4472454"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1991.10475035"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2005.01.011"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1111\/1467-9868.00330"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/4.736655"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/4.400428"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/4.658636"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065606"},{"key":"ref3","article-title":"Correlation aware statistical timing analysis with non-Gaussian delay distributions","author":"zhan","year":"2005","journal-title":"DAC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065751"},{"key":"ref5","article-title":"A framework for statistical timing analysis using non-linear delay and slew models","author":"bhardwaj","year":"2006","journal-title":"ICCAD"},{"key":"ref8","article-title":"A Methodology for Timing Model Characterization for Statistical Static Timing Analysis","author":"feng","year":"2007","journal-title":"DAC"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681573"},{"key":"ref2","article-title":"Statistical timing analysis considering spatial correlations using a single pert-like traversal","author":"chang","year":"2003","journal-title":"ICCAD"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.31"},{"key":"ref1","first-page":"331","article-title":"First-order incremental block-based statistical timing analysis","author":"visweswariah","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2005.115"},{"key":"ref22","article-title":"Linear Analysis of Random Process Variability","author":"wang","year":"2008","journal-title":"ICCAD"},{"key":"ref21","article-title":"A Gate Delay Modeling Focusing on Current Fluctuation over Wide-Rang of Process and Environmental Variability","author":"shinkai","year":"2006","journal-title":"ICCAD"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397336"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2010,3,22]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450543.pdf?arnumber=5450543","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T16:06:23Z","timestamp":1489853183000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450543\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450543","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}