{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,17]],"date-time":"2026-02-17T12:16:10Z","timestamp":1771330570866,"version":"3.50.1"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/isqed.2010.5450549","type":"proceedings-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T13:45:07Z","timestamp":1271771107000},"page":"356-361","source":"Crossref","is-referenced-by-count":9,"title":["Using time-aware memory sensing to address resistance drift issue in multi-level phase change memory"],"prefix":"10.1109","author":[{"family":"Wei Xu","sequence":"first","affiliation":[]},{"family":"Tong Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.888752"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2016397"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.3088859"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2005.852852"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418973"},{"key":"ref3","first-page":"428","article-title":"A multi-level-cell bipolar-selected phase-change memory","author":"bedeschi","year":"2008","journal-title":"IEEE International Solid-State Circuits Conference"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.888349"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2005.10.046"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568698"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418854"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1109\/EDSSC.2005.1635274","article-title":"The quest for the universal semiconductor memory","author":"lam","year":"2005","journal-title":"IEEE Conference on Electron Devices and Solid-State Circuits"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.825805"}],"event":{"name":"2010 11th International Symposium on Quality of Electronic Design (ISQED)","location":"San Jose, CA, USA","start":{"date-parts":[[2010,3,22]]},"end":{"date-parts":[[2010,3,24]]}},"container-title":["2010 11th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5443864\/5450389\/05450549.pdf?arnumber=5450549","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,28]],"date-time":"2019-05-28T14:46:04Z","timestamp":1559054764000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5450549\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/isqed.2010.5450549","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}