{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T06:55:00Z","timestamp":1725432900105},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/isqed.2011.5770780","type":"proceedings-article","created":{"date-parts":[[2011,5,24]],"date-time":"2011-05-24T15:17:26Z","timestamp":1306250246000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["Reliability — A highly important product attribute for the world's poorest consumers"],"prefix":"10.1109","author":[{"given":"Joseph","family":"Fjelstad","sequence":"first","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"ref3"},{"year":"0","key":"ref2"},{"year":"0","key":"ref1"}],"event":{"name":"2011 International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2011,3,14]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2011,3,16]]}},"container-title":["2011 12th International Symposium on Quality Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5764309\/5770683\/05770780.pdf?arnumber=5770780","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T02:35:53Z","timestamp":1490063753000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5770780\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/isqed.2011.5770780","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}