{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T21:37:37Z","timestamp":1729633057713,"version":"3.28.0"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/isqed.2011.5770806","type":"proceedings-article","created":{"date-parts":[[2011,5,24]],"date-time":"2011-05-24T19:17:26Z","timestamp":1306264646000},"page":"1-8","source":"Crossref","is-referenced-by-count":5,"title":["Timing yield estimation of carbon nanotube-based digital circuits in the presence of nanotube density variation and metallic-nanotubes"],"prefix":"10.1109","author":[{"given":"Behnam","family":"Ghavami","sequence":"first","affiliation":[]},{"given":"Mohsen","family":"Raji","sequence":"additional","affiliation":[]},{"given":"Hossein","family":"Pedram","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2010604"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837497"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2010.2058126"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2023197"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541383"},{"key":"ref15","first-page":"1009","article-title":"Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits","author":"zhang","year":"2008","journal-title":"Proc DATE"},{"key":"ref16","first-page":"958","article-title":"Automated Design of Misaligned-Carbon-Nanotube-Immune Circuits","author":"patil","year":"2007","journal-title":"ACM\/IEEE Design Automat Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/nature01797"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/370155.370308"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.2956677"},{"key":"ref28","first-page":"85","volume":"9","author":"clark","year":"1961","journal-title":"The Greatest of A Finite Set of Random Variables"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"35","DOI":"10.1021\/nl034841q","article-title":"Extraordinary Mobility in Semiconducting Carbon Nanotubes","volume":"4","author":"durkop","year":"2004","journal-title":"Nano Lett"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/56.3.635"},{"key":"ref3","first-page":"11","article-title":"The Future of Integrated Circuits: A Survey of Nanoelectronics","volume":"98","author":"hauck","year":"2009","journal-title":"Proceedings of the IEEE"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/nl035185x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.84.2941"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2002.1005429"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.883816"},{"year":"0","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2003.1234339"},{"journal-title":"ITRS International Technology Roadmap for Semiconductors Emerging Research Devices","year":"2010","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.66.045411"},{"key":"ref22","article-title":"Carbon Nanotube Transistor Circuits: Circuit-level Performance Benchmarking and Design Options for Living with Imperfections","author":"deng","year":"2007","journal-title":"Dig Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629933"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1021\/ja028599l"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2008.2006903"},{"journal-title":"A First Course in Probability","year":"2001","author":"ross","key":"ref26"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"344","DOI":"10.1126\/science.1086534","article-title":"Separation of metallic from semiconducting single-walled carbon nanotubes","volume":"301","author":"krupke","year":"2003","journal-title":"Science"}],"event":{"name":"2011 International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2011,3,14]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2011,3,16]]}},"container-title":["2011 12th International Symposium on Quality Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5764309\/5770683\/05770806.pdf?arnumber=5770806","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T00:42:43Z","timestamp":1497919363000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5770806\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/isqed.2011.5770806","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}