{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:13:36Z","timestamp":1763468016139},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/isqed.2011.5770808","type":"proceedings-article","created":{"date-parts":[[2011,5,24]],"date-time":"2011-05-24T19:17:26Z","timestamp":1306264646000},"source":"Crossref","is-referenced-by-count":25,"title":["Analysis of within-die process variation in 65nm FPGAs"],"prefix":"10.1109","author":[{"given":"Tim","family":"Tuan","sequence":"first","affiliation":[]},{"given":"Austin","family":"Lesea","sequence":"additional","affiliation":[]},{"given":"Chris","family":"Kingsley","sequence":"additional","affiliation":[]},{"given":"Steve","family":"Trimberger","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297743"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/66.554480"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2006.270300"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687479"},{"key":"ref8","year":"0","journal-title":"Virtex-5 Datasheet"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2006.311192"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433997"},{"key":"ref9","article-title":"System with downstream set or clear for measuring signal propagation delays","author":"kingsley","year":"0"},{"key":"ref1","article-title":"Characterizing Process Variation in Nanometer CMOS","author":"agarwal","year":"0","journal-title":"Design Automation Conference"}],"event":{"name":"2011 International Symposium on Quality Electronic Design (ISQED)","location":"Santa Clara, CA, USA","start":{"date-parts":[[2011,3,14]]},"end":{"date-parts":[[2011,3,16]]}},"container-title":["2011 12th International Symposium on Quality Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5764309\/5770683\/05770808.pdf?arnumber=5770808","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:46:40Z","timestamp":1490078800000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5770808\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/isqed.2011.5770808","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}