{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T14:46:24Z","timestamp":1725461184572},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/isqed.2012.6187505","type":"proceedings-article","created":{"date-parts":[[2012,4,25]],"date-time":"2012-04-25T16:08:50Z","timestamp":1335370130000},"page":"270-274","source":"Crossref","is-referenced-by-count":0,"title":["Quasi-Planar Tri-gate (QPT) bulk CMOS technology for single-port SRAM application"],"prefix":"10.1109","author":[{"given":"Yasumasa","family":"Tsukamoto","sequence":"first","affiliation":[]},{"given":"Makoto","family":"Yabuuchi","sequence":"additional","affiliation":[]},{"given":"Hidehiro","family":"Fujiwara","sequence":"additional","affiliation":[]},{"given":"Koji","family":"Nii","sequence":"additional","affiliation":[]},{"given":"Changhwan","family":"Shin","sequence":"additional","affiliation":[]},{"given":"Tsu-Jae King","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1147\/rd.504.0339"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560101"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.06.022"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.913744"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.919795"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373426"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705290"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2005.1494078"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2010.5618437"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2030711"}],"event":{"name":"2012 13th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2012,3,19]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2012,3,21]]}},"container-title":["Thirteenth International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6182938\/6187454\/06187505.pdf?arnumber=6187505","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T09:55:19Z","timestamp":1490090119000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6187505\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/isqed.2012.6187505","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}