{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T04:04:11Z","timestamp":1725768251489},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/isqed.2012.6187509","type":"proceedings-article","created":{"date-parts":[[2012,4,25]],"date-time":"2012-04-25T16:08:50Z","timestamp":1335370130000},"page":"298-305","source":"Crossref","is-referenced-by-count":7,"title":["Robust metastability-based TRNG design in nanometer CMOS with sub-vdd pre-charge and hybrid self-calibration"],"prefix":"10.1109","author":[{"given":"Vikram B.","family":"Suresh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wayne P.","family":"Burleson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2009.69"},{"journal-title":"A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications","year":"0","key":"22"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910965"},{"key":"18","first-page":"203","article-title":"2.4GHz 7mW all-digital PVTvariation tolerant True Random Number Generator in 45nm CMOS","author":"srinivasan","year":"0","journal-title":"VLSI Circuits (VLSIC) 2010 IEEE Symposium On June 2010"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1049\/el:20091899"},{"key":"13","article-title":"The Frequency Injection Attack on Ring Oscillator based True Random Number Generators","author":"markettos","year":"2009","journal-title":"CHES"},{"key":"14","first-page":"117","article-title":"A 1.04 ?W Truly Random Number Generator for Gen2 RFID tag","author":"chen","year":"0","journal-title":"Solid-State Circuits Conference 2009 A-SSCC 2009 IEEE Asian 2009"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2008.4629939"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.250627"},{"journal-title":"BSIM4v4 7 MOSFET Model","year":"0","key":"21"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687534"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513099"},{"key":"2","first-page":"450","article-title":"Adaptive post-silicon tuning for analog circuits: Concept, analysis and optimization","author":"li","year":"0","journal-title":"Computer-Aided Design 2007 ICCAD 2007 IEEE\/ACM International Conference on 2007"},{"journal-title":"The International Technology Roadmap for Semiconductors","year":"0","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2010.5450535"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355650"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810327"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2006.320103"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.915529"},{"key":"9","first-page":"263","article-title":"A Process Variation Tolerant Self-Compensating Sense Amplifier Design","author":"choudhary","year":"0","journal-title":"VLSI 2009 ISVLSI '09 IEEE Computer Society Annual Symposium On 13-15 2009"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700565"}],"event":{"name":"2012 13th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2012,3,19]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2012,3,21]]}},"container-title":["Thirteenth International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6182938\/6187454\/06187509.pdf?arnumber=6187509","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T09:58:01Z","timestamp":1490090281000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6187509\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/isqed.2012.6187509","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}