{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T04:59:04Z","timestamp":1725512344741},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/isqed.2012.6187547","type":"proceedings-article","created":{"date-parts":[[2012,4,25]],"date-time":"2012-04-25T20:08:50Z","timestamp":1335384530000},"page":"545-552","source":"Crossref","is-referenced-by-count":1,"title":["Speed-path analysis for multi-path failed latches with random variation"],"prefix":"10.1109","author":[{"given":"Tsutomu","family":"Ishida","sequence":"first","affiliation":[]},{"given":"Izumi","family":"Nitta","sequence":"additional","affiliation":[]},{"given":"Katsumi","family":"Homma","sequence":"additional","affiliation":[]},{"given":"Yuzi","family":"Kanazawa","sequence":"additional","affiliation":[]},{"given":"Hiroaki","family":"Komatsu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.12"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4483961"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512756"},{"key":"12","article-title":"Using Transition Test to Under-stand Timing Behavior of Logic Circuits on UltraS-PARCTM T2 Family","author":"chen","year":"0","journal-title":"Proc ITC 2009"},{"key":"3","first-page":"355","article-title":"Statistical Diagnosis of Unmodeled Systematic Tim-ing Effects","author":"bastani","year":"0","journal-title":"Proc DAC 2008"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.61"},{"key":"1","first-page":"390","article-title":"Silicon Speedpath Measurement and Feedback into EDA flows","author":"killpack","year":"0","journal-title":"Proc DAC 2007"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382701"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355708"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630005"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699258"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700588"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2006.1594706"},{"key":"8","doi-asserted-by":"crossref","first-page":"217","DOI":"10.1145\/1391469.1391524","article-title":"speedpath prediction based on learning from a small set of examples","author":"bastani","year":"2008","journal-title":"2008 45th ACM\/IEEE Design Automation Conference DAC"}],"event":{"name":"2012 13th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2012,3,19]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2012,3,21]]}},"container-title":["Thirteenth International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6182938\/6187454\/06187547.pdf?arnumber=6187547","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T17:52:12Z","timestamp":1497981132000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6187547\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/isqed.2012.6187547","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}