{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T20:04:08Z","timestamp":1725393848624},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,3]]},"DOI":"10.1109\/isqed.2013.6523646","type":"proceedings-article","created":{"date-parts":[[2013,6,13]],"date-time":"2013-06-13T16:54:03Z","timestamp":1371142443000},"page":"422-429","source":"Crossref","is-referenced-by-count":0,"title":["Peak power reduction of a sensor network processor fabricated with Deeply Depleted Channel transistors in 65nm technology"],"prefix":"10.1109","author":[{"given":"K.","family":"Kawakami","sequence":"first","affiliation":[]},{"given":"T.","family":"Shiro","sequence":"additional","affiliation":[]},{"given":"H.","family":"Yamasaki","sequence":"additional","affiliation":[]},{"given":"K.","family":"Yoda","sequence":"additional","affiliation":[]},{"given":"H.","family":"Fujimoto","sequence":"additional","affiliation":[]},{"given":"K.","family":"Kawasaki","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Watanabe","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803957"},{"key":"17","first-page":"331","article-title":"Advanced channel engineering achieving aggressive reduction of VT variation for ultra-low-power applications","author":"fujita","year":"2011","journal-title":"Proc Int Electron Devices Meeting (IEDM)"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2231038"},{"year":"0","key":"15"},{"key":"16","first-page":"489","article-title":"Reducing transistor variability for high performance low power chips","author":"rogenmoser","year":"2012","journal-title":"Proc HotChips"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2011.5872206"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/16.777162"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/16.711362"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2010.5556120"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803941"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/16.870557"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2001.922064"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1997.650512"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2012.6166279"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.907802"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584080"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870796"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2004.827001"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418975"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.838013"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.810043"}],"event":{"name":"2013 14th International Symposium on Quality Electronic Design (ISQED 2013)","start":{"date-parts":[[2013,3,4]]},"location":"Santa Clara, CA","end":{"date-parts":[[2013,3,6]]}},"container-title":["International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6520923\/6523572\/06523646.pdf?arnumber=6523646","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T23:53:21Z","timestamp":1490226801000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6523646\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/isqed.2013.6523646","relation":{},"subject":[],"published":{"date-parts":[[2013,3]]}}}