{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T07:06:58Z","timestamp":1729667218006,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,3]]},"DOI":"10.1109\/isqed.2013.6523680","type":"proceedings-article","created":{"date-parts":[[2013,6,13]],"date-time":"2013-06-13T16:54:03Z","timestamp":1371142443000},"page":"658-664","source":"Crossref","is-referenced-by-count":3,"title":["RF passive device modeling and characterization in 65nm CMOS technology"],"prefix":"10.1109","author":[{"given":"E.","family":"Lourandakis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Stefanou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Nikellis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Bantas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/SMIC.2010.5422827"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.808682"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1996.512297"},{"key":"15","article-title":"Inductance calculations, working formulas, tables","author":"grover","year":"1946","journal-title":"Van Nostrand Reinhold"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1147\/rd.165.0470"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.1990.323996"},{"journal-title":"RF Measurements of Die and Packages","year":"2002","author":"wartenberg","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/33.239889"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882489"},{"journal-title":"Analytical Computational Methods in Electromagnetics","year":"2008","author":"garg","key":"3"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2180909"},{"year":"0","key":"2"},{"year":"0","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/22.120096"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1983.21093"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/SiRF.2012.6160144"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269196"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/82.861403"},{"key":"9","doi-asserted-by":"crossref","first-page":"608","DOI":"10.1109\/TMTT.1976.1128917","article-title":"Analytical ic metal-line capacitance formulas","volume":"24","author":"chang","year":"1976","journal-title":"IEEE Trans on Microwave Theory and Techniques"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1049\/el:19960689"}],"event":{"name":"2013 14th International Symposium on Quality Electronic Design (ISQED 2013)","start":{"date-parts":[[2013,3,4]]},"location":"Santa Clara, CA","end":{"date-parts":[[2013,3,6]]}},"container-title":["International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6520923\/6523572\/06523680.pdf?arnumber=6523680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T10:35:48Z","timestamp":1498041348000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6523680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/isqed.2013.6523680","relation":{},"subject":[],"published":{"date-parts":[[2013,3]]}}}