{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:05:37Z","timestamp":1725699937837},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,3]]},"DOI":"10.1109\/isqed.2013.6523681","type":"proceedings-article","created":{"date-parts":[[2013,6,13]],"date-time":"2013-06-13T16:54:03Z","timestamp":1371142443000},"page":"665-669","source":"Crossref","is-referenced-by-count":3,"title":["An efficient method for ECSM characterization of CMOS inverter in nanometer range technologies"],"prefix":"10.1109","author":[{"given":"B.","family":"Kaur","sequence":"first","affiliation":[]},{"given":"S.","family":"Miryala","sequence":"additional","affiliation":[]},{"given":"S. K.","family":"Manhas","sequence":"additional","affiliation":[]},{"given":"B.","family":"Anand","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775933"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2009.5338883"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187549"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2024945"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146975"},{"key":"5","first-page":"363","article-title":"A waveform independent gate model for accurate timing analysis","author":"li","year":"2005","journal-title":"Proceedings of JEEE International Conference on Computer Design VLSI in Computers and Processors"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382562"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770767"}],"event":{"name":"2013 14th International Symposium on Quality Electronic Design (ISQED 2013)","start":{"date-parts":[[2013,3,4]]},"location":"Santa Clara, CA","end":{"date-parts":[[2013,3,6]]}},"container-title":["International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6520923\/6523572\/06523681.pdf?arnumber=6523681","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T23:47:19Z","timestamp":1490226439000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6523681\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/isqed.2013.6523681","relation":{},"subject":[],"published":{"date-parts":[[2013,3]]}}}