{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:58:22Z","timestamp":1725706702853},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,3]]},"DOI":"10.1109\/isqed.2013.6523687","type":"proceedings-article","created":{"date-parts":[[2013,6,13]],"date-time":"2013-06-13T20:54:03Z","timestamp":1371156843000},"page":"703-708","source":"Crossref","is-referenced-by-count":10,"title":["Analysis and comparison of XOR cell structures for low voltage circuit design"],"prefix":"10.1109","author":[{"given":"S.","family":"Nishizawa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Ishihara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Onodera","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"153","article-title":"Variation-sensitive monitor circuits for estimation of die-to-die process variation","author":"mahfzul","year":"2011","journal-title":"International Conference on Microelectronic Test Structures"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCT.2011.6075163"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.303715"},{"journal-title":"HSIM Simulation Reference","year":"2009","key":"6"},{"year":"0","author":"weste","key":"5"},{"key":"4","first-page":"265","article-title":"Logic style comparison using 32-bit cla in 90nm technology","author":"joy sebastian alvionne","year":"2011","journal-title":"Asian Modelling Symposium"}],"event":{"name":"2013 14th International Symposium on Quality Electronic Design (ISQED 2013)","start":{"date-parts":[[2013,3,4]]},"location":"Santa Clara, CA","end":{"date-parts":[[2013,3,6]]}},"container-title":["International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6520923\/6523572\/06523687.pdf?arnumber=6523687","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T03:03:38Z","timestamp":1490238218000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6523687\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isqed.2013.6523687","relation":{},"subject":[],"published":{"date-parts":[[2013,3]]}}}