{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T19:35:57Z","timestamp":1729625757263,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,3]]},"DOI":"10.1109\/isqed.2014.6783318","type":"proceedings-article","created":{"date-parts":[[2014,4,16]],"date-time":"2014-04-16T21:24:16Z","timestamp":1397683456000},"page":"148-155","source":"Crossref","is-referenced-by-count":39,"title":["Efficient trace signal selection using augmentation and ILP techniques"],"prefix":"10.1109","author":[{"given":"Kamran","family":"Rahmani","sequence":"first","affiliation":[]},{"given":"Prabhat","family":"Mishra","sequence":"additional","affiliation":[]},{"given":"Sandip","family":"Ray","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","author":"williams","journal-title":"Icarus verilog","key":"15"},{"key":"16","first-page":"892","article-title":"Silicon debug: Scan chains alone are not enough","author":"van rootselaar","year":"1999","journal-title":"Test Conference 1999 Proceedings International"},{"doi-asserted-by":"publisher","key":"13","DOI":"10.1109\/ICCD.2013.6657069"},{"doi-asserted-by":"publisher","key":"14","DOI":"10.1109\/ICCAD.2010.5654123"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1109\/ATS.2009.20"},{"key":"12","article-title":"E-cient signal selection using-ne-grained combination of scan and trace bu-ers","author":"rahmani","year":"2013","journal-title":"VLSI Design (VLSI Design) 2013 26th International Conference on"},{"key":"3","first-page":"1","article-title":"E-cient combination of trace and scan signals for post silicon validation and debug","author":"basu","year":"2011","journal-title":"ITC"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/TVLSI.2012.2192457"},{"year":"0","journal-title":"LP solve","key":"1"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1145\/1837274.1837300"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/ETSYM.2010.5512781"},{"key":"6","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1109\/TCAD.2008.2009158","article-title":"Algorithms for state restoration and trace-signal selection for data acquisition in silicon debug","volume":"28","author":"ko","year":"2009","journal-title":"Computer-Aided Design of Integrated Circuits and Systems IEEE Transactions on"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/ETSYM.2004.1347600"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/ICCAD.2011.6105391"},{"key":"9","first-page":"1338","article-title":"Trace signal selection for visibility enhancement in post-silicon validation","volume":"9","author":"liu","year":"2009","journal-title":"2009 Design Automation & Test in Europe Conference & Exhibition date"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.7873\/DATE.2013.111"}],"event":{"name":"2014 15th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2014,3,3]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2014,3,5]]}},"container-title":["Fifteenth International Symposium on Quality Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6779216\/6783285\/06783318.pdf?arnumber=6783318","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T11:43:29Z","timestamp":1498131809000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6783318\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/isqed.2014.6783318","relation":{},"subject":[],"published":{"date-parts":[[2014,3]]}}}