{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T06:36:46Z","timestamp":1725777406307},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,3]]},"DOI":"10.1109\/isqed.2014.6783332","type":"proceedings-article","created":{"date-parts":[[2014,4,16]],"date-time":"2014-04-16T21:24:16Z","timestamp":1397683456000},"page":"243-248","source":"Crossref","is-referenced-by-count":10,"title":["Fast, accurate variation-aware path timing computation for sub-threshold circuits"],"prefix":"10.1109","author":[{"given":"Yanqing","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benton H.","family":"Calhoun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Bit PIC Product","year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433921"},{"key":"10","first-page":"195","author":"crow","year":"1988","journal-title":"Lognormal Distributions Theory and Applications"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2221217"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852164"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2006096"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2003.1195028"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456911"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.895613"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147022"}],"event":{"name":"2014 15th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2014,3,3]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2014,3,5]]}},"container-title":["Fifteenth International Symposium on Quality Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6779216\/6783285\/06783332.pdf?arnumber=6783332","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T16:51:08Z","timestamp":1490287868000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6783332\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/isqed.2014.6783332","relation":{},"subject":[],"published":{"date-parts":[[2014,3]]}}}