{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:43:02Z","timestamp":1761648182835,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,3]]},"DOI":"10.1109\/isqed.2014.6783358","type":"proceedings-article","created":{"date-parts":[[2014,4,16]],"date-time":"2014-04-16T17:24:16Z","timestamp":1397669056000},"page":"442-449","source":"Crossref","is-referenced-by-count":3,"title":["Systematic analyses for latching probability of single-event transients"],"prefix":"10.1109","author":[{"given":"Hoda","family":"Pahlevanzadeh","sequence":"first","affiliation":[]},{"given":"Qiaoyan","family":"Yu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061131"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.895549"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000039608.48856.33"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839174"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70231"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2009.77"},{"key":"14","first-page":"170","article-title":"An efficient probability framework for error propagation and correlation estimation","volume":"12","author":"chen","year":"2012","journal-title":"Proc IOLTS"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.49"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.46"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2011.5958246"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839173"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862738"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2013346"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2112378"},{"key":"6","first-page":"506","article-title":"Single event crosstalk shielding for CMOS logic","volume":"41","author":"sayil","year":"2010","journal-title":"Microelectronic Journal"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910125"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2226096"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.49"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2006.1649611"}],"event":{"name":"2014 15th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2014,3,3]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2014,3,5]]}},"container-title":["Fifteenth International Symposium on Quality Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6779216\/6783285\/06783358.pdf?arnumber=6783358","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T12:40:57Z","timestamp":1490272857000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6783358\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/isqed.2014.6783358","relation":{},"subject":[],"published":{"date-parts":[[2014,3]]}}}