{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:14:32Z","timestamp":1729649672546,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,3]]},"DOI":"10.1109\/isqed.2014.6783363","type":"proceedings-article","created":{"date-parts":[[2014,4,16]],"date-time":"2014-04-16T21:24:16Z","timestamp":1397683456000},"page":"480-485","source":"Crossref","is-referenced-by-count":4,"title":["Fine grained wearout sensing using metastability resolution time"],"prefix":"10.1109","author":[{"given":"Vikram B.","family":"Suresh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wayne P.","family":"Burleson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.852523"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433994"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558941"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2100531"},{"key":"5","first-page":"735","article-title":"An efficient method to identify critical gates under circuit aging","author":"wang","year":"2007","journal-title":"IEEE\/A CM International Confrrence on Computer-Aided Design"},{"key":"4","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1109\/IPFA.2006.250993","article-title":"Impact of random bit values on nbti lifetime of an sr.am cell","volume":"2006","author":"wittmaim","year":"2006","journal-title":"Physical and Failure Analysis of Integrated Circuits"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5117765"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2168246"},{"journal-title":"Predictive technology models","year":"0","key":"12"}],"event":{"name":"2014 15th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2014,3,3]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2014,3,5]]}},"container-title":["Fifteenth International Symposium on Quality Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6779216\/6783285\/06783363.pdf?arnumber=6783363","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T11:43:24Z","timestamp":1498131804000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6783363\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/isqed.2014.6783363","relation":{},"subject":[],"published":{"date-parts":[[2014,3]]}}}