{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:58:44Z","timestamp":1729677524917,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/isqed.2016.7479210","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T20:27:41Z","timestamp":1464294461000},"page":"258-262","source":"Crossref","is-referenced-by-count":6,"title":["Near-threshold circuit variability in 14nm FinFETs for ultra-low power applications"],"prefix":"10.1109","author":[{"given":"Sriram","family":"Balasubramanian","sequence":"first","affiliation":[]},{"given":"Ninad","family":"Pimparkar","sequence":"additional","affiliation":[]},{"given":"Mangesh","family":"Kushare","sequence":"additional","affiliation":[]},{"given":"Vinayak","family":"Mahajan","sequence":"additional","affiliation":[]},{"given":"Juhi","family":"Bansal","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Shimizu","sequence":"additional","affiliation":[]},{"given":"Vivek","family":"Joshi","sequence":"additional","affiliation":[]},{"given":"Kun","family":"Qian","sequence":"additional","affiliation":[]},{"given":"Arunima","family":"Dasgupta","sequence":"additional","affiliation":[]},{"given":"Karthik","family":"Chandrasekaran","sequence":"additional","affiliation":[]},{"given":"Chad","family":"Weintraub","sequence":"additional","affiliation":[]},{"given":"Ali","family":"Icel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"559","author":"fuketa","year":"2011","journal-title":"IEEE IEDM"},{"key":"ref3","first-page":"7","author":"horowitz","year":"2005","journal-title":"IEEE IEDM"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"253","DOI":"10.1109\/JPROC.2009.2034764","volume":"98 2","author":"dreslinski","year":"2010","journal-title":"Proceedings of the IEEE"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"338","DOI":"10.1145\/775832.775920","author":"borkar","year":"2003","journal-title":"Proceedings of DAC"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2193129"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"ref2","first-page":"35","author":"brodersen","year":"2002","journal-title":"Proc IEEE\/ACM ICCAD"},{"key":"ref1","first-page":"473","volume":"27","author":"chandrakasan","year":"0","journal-title":"IEEE JSSC"}],"event":{"name":"2016 17th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2016,3,15]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2016,3,16]]}},"container-title":["2016 17th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7470728\/7479140\/07479210.pdf?arnumber=7479210","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,18]],"date-time":"2023-08-18T16:59:54Z","timestamp":1692377994000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7479210\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isqed.2016.7479210","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}