{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:32:20Z","timestamp":1729629140886,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/isqed.2016.7479231","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T16:27:41Z","timestamp":1464280061000},"page":"380-385","source":"Crossref","is-referenced-by-count":0,"title":["0.5-V 50-mV-swing 1.2-GHz 28-nm-FD-SOI 32-bit dynamic bus architecture with dummy bus"],"prefix":"10.1109","author":[{"given":"Khaja Ahmad","family":"Shaik","sequence":"first","affiliation":[]},{"given":"Kiyoo","family":"Itoh","sequence":"additional","affiliation":[]},{"given":"Amara","family":"Amara","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Leakage in Nanometer CMOS Technologies","year":"2005","author":"narendra","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/4.84943"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-04478-0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/4.75040"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465542"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.210023"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.933468"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/92.845893"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2014.08.004"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063050"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2109630"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"663","DOI":"10.1109\/4.293111","article-title":"Power consumption estimation in CMOS VLSI chips","volume":"29","author":"liu","year":"1994","journal-title":"IEEE J Solid-Sate Circuits"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487798"}],"event":{"name":"2016 17th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2016,3,15]]},"location":"Santa Clara, CA","end":{"date-parts":[[2016,3,16]]}},"container-title":["2016 17th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7470728\/7479140\/07479231.pdf?arnumber=7479231","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T11:08:47Z","timestamp":1498302527000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7479231\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/isqed.2016.7479231","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}