{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T15:40:58Z","timestamp":1780674058246,"version":"3.54.1"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/isqed.2016.7479236","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T16:27:41Z","timestamp":1464280061000},"page":"410-415","source":"Crossref","is-referenced-by-count":5,"title":["Efficient analog circuit optimization using sparse regression and error margining"],"prefix":"10.1109","author":[{"given":"Mohamed Baker","family":"Alawieh","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fa","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rouwaida","family":"Kanj","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rajiv","family":"Joshi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/81.739265"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2021034"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391482"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837500"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2012.6330570"},{"key":"ref16","first-page":"1661","article-title":"Finding deterministic solution from underdetermined equation: large-scale performance modeling of analog\/RF circuits","volume":"29","author":"li","year":"2011","journal-title":"IEEE TCAD"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2014.6881491"},{"key":"ref18","first-page":"855","article-title":"Robust analog\/RF circuit design with projection-based posynomial modeling","author":"li","year":"2004","journal-title":"ICCAD"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2014.6742932"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2011.2180092"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229172"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.905672"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1561\/1000000008"},{"key":"ref8","first-page":"928","article-title":"Efficient parametric yield extraction for multiple correlated non-Normal performance distributions of analog\/RF circuits","author":"li","year":"2007","journal-title":"DAC"},{"key":"ref7","first-page":"779","article-title":"A new class of convex functions for delay modeling and its application to the transistor sizing problem","volume":"19","author":"kasamsetty","year":"2000","journal-title":"IEEE TCAD"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/5.899053"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681555"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144283"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2199115"},{"key":"ref21","author":"bishop","year":"2006","journal-title":"Pattern Recognition and Machine Learning"}],"event":{"name":"2016 17th International Symposium on Quality Electronic Design (ISQED)","location":"Santa Clara, CA, USA","start":{"date-parts":[[2016,3,15]]},"end":{"date-parts":[[2016,3,16]]}},"container-title":["2016 17th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7470728\/7479140\/07479236.pdf?arnumber=7479236","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,23]],"date-time":"2016-09-23T15:59:16Z","timestamp":1474646356000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7479236\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/isqed.2016.7479236","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}