{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T00:30:25Z","timestamp":1725409825347},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/isqed.2016.7479239","type":"proceedings-article","created":{"date-parts":[[2016,5,26]],"date-time":"2016-05-26T16:27:41Z","timestamp":1464280061000},"page":"430-436","source":"Crossref","is-referenced-by-count":0,"title":["Multiple shift-vector importance sampling method using support vector machine and clustering for high-density DRAM designs"],"prefix":"10.1109","author":[{"family":"Jinyoung Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Sunghee Yun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jeongha Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Dongsoo Kang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jeongyeol Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Sanghoon Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"The Elements of Statistical Learning Data Mining Inference and Prediction","year":"2009","author":"hastie","key":"ref4"},{"key":"ref3","first-page":"15","article-title":"Takanori Date. Robust importance sampling for efficient SRAM yield analysis","year":"2010","journal-title":"International Symposium on Quality Electronic Design"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654259"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229167"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691160"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008202821328"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.273749"}],"event":{"name":"2016 17th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2016,3,15]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2016,3,16]]}},"container-title":["2016 17th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7470728\/7479140\/07479239.pdf?arnumber=7479239","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,23]],"date-time":"2016-09-23T15:59:17Z","timestamp":1474646357000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7479239\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isqed.2016.7479239","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}