{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T07:23:13Z","timestamp":1751095393322},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.1109\/isqed.2017.7918305","type":"proceedings-article","created":{"date-parts":[[2017,5,4]],"date-time":"2017-05-04T16:32:38Z","timestamp":1493915558000},"page":"131-137","source":"Crossref","is-referenced-by-count":1,"title":["A case for standard-cell based RAMs in highly-ported superscalar processor structures"],"prefix":"10.1109","author":[{"family":"Sungkwan Ku","sequence":"first","affiliation":[]},{"given":"Elliott","family":"Forbes","sequence":"additional","affiliation":[]},{"given":"Rangeen Basu Roy","family":"Chowdhury","sequence":"additional","affiliation":[]},{"given":"Eric","family":"Rotenberg","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2016.7482096"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2035451"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2011.2143150"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865601"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2014.2380200"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2012.6189225"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MSE.2007.44"},{"journal-title":"FabMem A Multiported RAM and CAM Compiler for Superscalar Design Space Exploration","year":"2010","author":"shah","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852159"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/859618.859627"},{"journal-title":"ARM Embedded Memory IP SRAM Register File and ROM Memory Compiler","year":"0","key":"ref1"}],"event":{"name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2017,3,14]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2017,3,15]]}},"container-title":["2017 18th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7910185\/7918273\/07918305.pdf?arnumber=7918305","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,22]],"date-time":"2017-05-22T17:48:20Z","timestamp":1495475300000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7918305\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/isqed.2017.7918305","relation":{},"subject":[],"published":{"date-parts":[[2017,3]]}}}