{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T04:21:41Z","timestamp":1729657301486,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.1109\/isqed.2017.7918346","type":"proceedings-article","created":{"date-parts":[[2017,5,4]],"date-time":"2017-05-04T16:32:38Z","timestamp":1493915558000},"page":"385-390","source":"Crossref","is-referenced-by-count":3,"title":["Post-fabrication calibration of Near-Threshold circuits for energy efficiency"],"prefix":"10.1109","author":[{"given":"Mohammad Saber","family":"Golanbari","sequence":"first","affiliation":[]},{"given":"Saman","family":"Kiamehr","sequence":"additional","affiliation":[]},{"given":"Fabian","family":"Oboril","sequence":"additional","affiliation":[]},{"given":"Anteneh","family":"Gebregiorgis","sequence":"additional","affiliation":[]},{"given":"Mehdi B.","family":"Tahoori","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.914720"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917553"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2442614"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2013.6571906"},{"journal-title":"Monte Carlo Methods","year":"2013","author":"hammersley","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9473(01)00065-2"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1007\/BF02985802","article-title":"The elements of statistical learning: data mining, inference and prediction","volume":"27","author":"hastie","year":"2005","journal-title":"The Mathematical Intelligencer"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228572"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2034764"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2002.1016866"},{"key":"ref5","first-page":"66","article-title":"A 280mV-to-1.2V wide-operating-range IA-32 processor in 32nm CMOS","author":"jain","year":"2012","journal-title":"ISSCC"},{"key":"ref8","first-page":"1237","article-title":"Variation-Aware Near Threshold Circuit Synthesis","author":"mohammad saber golanbari","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.604077"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852162"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2002.995696"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2934583.2934635"}],"event":{"name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2017,3,14]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2017,3,15]]}},"container-title":["2017 18th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7910185\/7918273\/07918346.pdf?arnumber=7918346","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,25]],"date-time":"2017-06-25T11:58:59Z","timestamp":1498391939000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7918346\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/isqed.2017.7918346","relation":{},"subject":[],"published":{"date-parts":[[2017,3]]}}}