{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,31]],"date-time":"2025-08-31T10:38:02Z","timestamp":1756636682046,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/isqed.2018.8357256","type":"proceedings-article","created":{"date-parts":[[2018,5,18]],"date-time":"2018-05-18T17:30:27Z","timestamp":1526664627000},"page":"1-7","source":"Crossref","is-referenced-by-count":13,"title":["Concolic testing of SystemC designs"],"prefix":"10.1109","author":[{"given":"Bin","family":"Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai","family":"Cong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhenkun","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhigang","family":"Liao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tao","family":"Zhan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Havlicek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fei","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1081706.1081750"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691136"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MEMCOD.2011.5970527"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-89363-1_16"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1450135.1450166"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-22110-1_24"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228421"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488877"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2010.5496659"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2220336.2220350"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/360248.360252"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278527"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1950365.1950396"},{"key":"ref5","article-title":"KLEE: Unassisted and Automatic Generation of High-coverage Tests for Complex Systems Programs","author":"cadar","year":"2008","journal-title":"Proceedings of the 8th USENIX Conference on Operating Systems Design and Implementation"},{"key":"ref8","article-title":"Regression Testing of Virtual Prototypes Using Symbolic Execution","volume":"4","author":"lin","year":"2015","journal-title":"International Journal of Computer Science and Software Engineering (IJCSSE)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2013.44"},{"year":"0","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1064978.1065036"},{"journal-title":"IEEE Standards Association","article-title":"Standard SystemC Language Reference Manual","year":"2011","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428006"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2018.8297363"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2004.1281665"},{"key":"ref24","article-title":"Scoot: A Tool for the Analysis of SystemC Models","author":"nicolas","year":"2008","journal-title":"Proceedings of International Conference on Tools and Algorithms for the Construction and Analysis of System"},{"year":"0","key":"ref23"},{"year":"0","key":"ref25"}],"event":{"name":"2018 19th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2018,3,13]]},"location":"Santa Clara, CA","end":{"date-parts":[[2018,3,14]]}},"container-title":["2018 19th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8354411\/8357243\/08357256.pdf?arnumber=8357256","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T16:21:03Z","timestamp":1527870063000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8357256\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/isqed.2018.8357256","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}