{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:17:20Z","timestamp":1725506240759},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/isqed.2018.8357271","type":"proceedings-article","created":{"date-parts":[[2018,5,18]],"date-time":"2018-05-18T21:30:27Z","timestamp":1526679027000},"page":"94-99","source":"Crossref","is-referenced-by-count":0,"title":["Clock buffer and flip-flop co-optimization for reducing peak current noise"],"prefix":"10.1109","author":[{"given":"Joohan","family":"Kim","sequence":"first","affiliation":[]},{"given":"Taewhan","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2288698"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.10.004"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1287\/opre.35.1.70"},{"journal-title":"NANGATE","year":"2011","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364663"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2002.996772"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569827"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2016.24"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1118299.1118366"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009187"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065629"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.1996.547520"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.812310"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2066650"}],"event":{"name":"2018 19th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2018,3,13]]},"location":"Santa Clara, CA","end":{"date-parts":[[2018,3,14]]}},"container-title":["2018 19th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8354411\/8357243\/08357271.pdf?arnumber=8357271","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T20:21:06Z","timestamp":1527884466000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8357271\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/isqed.2018.8357271","relation":{},"subject":[],"published":{"date-parts":[[2018,3]]}}}