{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:00:31Z","timestamp":1725591631603},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/isqed.2019.8697494","type":"proceedings-article","created":{"date-parts":[[2019,4,26]],"date-time":"2019-04-26T03:49:36Z","timestamp":1556250576000},"page":"76-80","source":"Crossref","is-referenced-by-count":0,"title":["A Compact Model of Negative Bias Temperature Instability Suitable for Gate-Level Circuit Simulation"],"prefix":"10.1109","author":[{"given":"Xu","family":"Liu","sequence":"first","affiliation":[]},{"given":"Alessandro","family":"Bernardini","sequence":"additional","affiliation":[]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[]},{"given":"Xing","family":"Zhou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref12","first-page":"493","article-title":"An analytical model for negative bias temperature instability","author":"kumar","year":"0","journal-title":"Proceedings of the 2006 IEEE\/ACM International Conference on Computer-Aided Design"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269295"},{"key":"ref14","first-page":"370","article-title":"Nbti-aware synthesis of digital circuits","author":"kumar","year":"2007","journal-title":"Proceedings of the 44th Annual Design Automation Conference"},{"journal-title":"Aging Analysis of Digital Integrated Circuits","year":"2012","author":"lorenz","key":"ref15"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197745"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2004.1315337"},{"key":"ref6","first-page":"183","article-title":"Negative bias temperature instability of pmosfets with ultra-thinsion gate dielectrics","author":"tsujikawa","year":"0","journal-title":"Reliability Physics Symposium Proceedings 2003 41st Annual IEEE International"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197741"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.244119"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.51.4218"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.852523"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269296"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195975"}],"event":{"name":"2019 20th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2019,3,6]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2019,3,7]]}},"container-title":["20th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8682005\/8697223\/08697494.pdf?arnumber=8697494","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:12:30Z","timestamp":1657854750000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8697494\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/isqed.2019.8697494","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}