{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T08:03:37Z","timestamp":1767773017627},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1109\/isqed48828.2020.9136975","type":"proceedings-article","created":{"date-parts":[[2020,7,9]],"date-time":"2020-07-09T20:46:45Z","timestamp":1594327605000},"page":"197-197","source":"Crossref","is-referenced-by-count":6,"title":["A Morphable Physically Unclonable Function and True Random Number Generator using a Commercial Magnetic Memory"],"prefix":"10.1109","author":[{"given":"Mohammad Nasim Imtiaz","family":"Khan","sequence":"first","affiliation":[]},{"given":"Chak Yuen","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Sung Hao","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Abdullah","family":"Ash-Saki","sequence":"additional","affiliation":[]},{"given":"Swaroop","family":"Ghosh","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477292"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.7567\/APEX.7.083001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282212"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2809781"}],"event":{"name":"2020 21st International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2020,3,25]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2020,3,26]]}},"container-title":["2020 21st International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9131689\/9136966\/09136975.pdf?arnumber=9136975","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:52:38Z","timestamp":1656453158000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9136975\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/isqed48828.2020.9136975","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}