{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,28]],"date-time":"2025-09-28T20:25:41Z","timestamp":1759091141409},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1109\/isqed48828.2020.9136991","type":"proceedings-article","created":{"date-parts":[[2020,7,9]],"date-time":"2020-07-09T20:46:45Z","timestamp":1594327605000},"page":"7-13","source":"Crossref","is-referenced-by-count":21,"title":["SeqL: Secure Scan-Locking for IP Protection"],"prefix":"10.1109","author":[{"given":"Seetal","family":"Potluri","sequence":"first","affiliation":[]},{"given":"Aydin","family":"Aysu","sequence":"additional","affiliation":[]},{"given":"Akash","family":"Kumar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873671"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2017.7951830"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495588"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-53140-2_7"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3133985"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2893183"},{"key":"ref16","first-page":"1","article-title":"A scan obfuscation guided design-for-security approach for sequential circuits","author":"karmakar","year":"2019","journal-title":"IEEE TCAS II Express Briefs"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3060403.3060458"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2017.7951805"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203759"},{"key":"ref4","article-title":"SMT attack: Next generation attack on obfuscated circuits with capabilities and performance beyond the SAT attacks","author":"azar","year":"2019","journal-title":"CHES"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2017.2710954"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942047"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715163"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2797019"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3060403.3060469"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.193"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140252"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287670"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287691"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2018.8607163"},{"journal-title":"TSMC integrated backend services","year":"0","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287693"},{"journal-title":"V-scale an implementation of an RV32IM core in Verilog","year":"0","author":"magyar","key":"ref26"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2790297"}],"event":{"name":"2020 21st International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2020,3,25]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2020,3,26]]}},"container-title":["2020 21st International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9131689\/9136966\/09136991.pdf?arnumber=9136991","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:56:44Z","timestamp":1656453404000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9136991\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/isqed48828.2020.9136991","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}