{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T19:18:19Z","timestamp":1725736699386},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1109\/isqed48828.2020.9136994","type":"proceedings-article","created":{"date-parts":[[2020,7,9]],"date-time":"2020-07-09T20:46:45Z","timestamp":1594327605000},"page":"444-451","source":"Crossref","is-referenced-by-count":4,"title":["Insulator-Metal Transition Material Based Artificial Neurons: A Design Perspective"],"prefix":"10.1109","author":[{"given":"Ahmedullah","family":"Aziz","sequence":"first","affiliation":[]},{"given":"Kaushik","family":"Roy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2642884"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA.2016.7480499"},{"key":"ref12","first-page":"34.6.1","article-title":"Ag\/Hf02based threshold switch with extreme non-linearity for unipolar cross-point memory and steep-slope phase-FETs","author":"shukla","year":"0","journal-title":"2016 IEEE International Electron Devices Meeting (IEDM)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms8812"},{"key":"ref14","first-page":"1","article-title":"Cockcroft-Walton Multiplier based on Unipolar Ag\/Hf02\/Pt Threshold Switch","author":"aziz","year":"0","journal-title":"2018 76th Device Research Conference (DRC) DRC"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2873738"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2015.7175544"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2015.7273481"},{"journal-title":"Predictive Technology Model Arizona State University","year":"2018","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2412960"},{"key":"ref4","first-page":"186t","article-title":"Ultra-low power probabilistic IMT neurons for stochastic sampling machines","author":"jerry","year":"0","journal-title":"2017 Symposium on VLSI Technology"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2426495"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927045"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2016.7548503"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2620475"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/55.791931"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/APMRC.2018.8601053"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CONFLUENCE.2017.7943149"},{"key":"ref9","article-title":"Device-Circuit Co-Design Employing Phase Transition Materials for Low Power Electronics","author":"aziz","year":"2019","journal-title":"Figshare"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2771812"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510679"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2017.8053093"}],"event":{"name":"2020 21st International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2020,3,25]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2020,3,26]]}},"container-title":["2020 21st International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9131689\/9136966\/09136994.pdf?arnumber=9136994","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:56:43Z","timestamp":1656453403000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9136994\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/isqed48828.2020.9136994","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}