{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T11:59:48Z","timestamp":1725796788136},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,7]]},"DOI":"10.1109\/isqed51717.2021.9424285","type":"proceedings-article","created":{"date-parts":[[2021,5,10]],"date-time":"2021-05-10T20:09:51Z","timestamp":1620677391000},"page":"553-558","source":"Crossref","is-referenced-by-count":4,"title":["Runtime Long-Term Reliability Management Using Stochastic Computing in Deep Neural Networks"],"prefix":"10.1109","author":[{"given":"Yibo","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuyuan","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shaoyi","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sheldon X.-D.","family":"Tan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"Dynamic energyaccuracy trade-off using stochastic computing in deep neural networks","author":"kim","year":"2016","journal-title":"2016 53nd ACM\/EDAC\/IEEE Design Automation Conference (DAC) DAC"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858405"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062290"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317911"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927069"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2017.29"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428020"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2761740"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-5841-9_2"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"journal-title":"Degradation-Aware Cell Libraries V1 0","year":"0","key":"ref4"},{"journal-title":"2003 in International Sematech Technology Transfer Document 03024377A-TR","article-title":"Critical Reliability Challenges for The International Technology Roadmap for Semiconductors (ITRS)","year":"2003","key":"ref3"},{"journal-title":"VLSI Systems Long-Term Reliability - Modeling Simulation and Optimization","year":"2019","author":"tan","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.08.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2163630"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062331"},{"journal-title":"JEDEC Publication JEP122-A Jedec Solid State Technolgy Association","article-title":"Failure Mechanisms and Models for Semiconductor Devices","year":"2002","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2247429"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2778107"},{"key":"ref20","first-page":"1737","article-title":"Deep learning with limited numerical precision","author":"gupta","year":"2015","journal-title":"International Conference on Machine Learning"},{"key":"ref22","article-title":"Training deep neural networks with low precision multiplications","author":"courbariaux","year":"2014","journal-title":"arXiv Learning"},{"journal-title":"Improving the Speed of Neural Networks on Cpus","year":"2011","author":"vanhoucke","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-00816-5"},{"journal-title":"Deep Learning","year":"2016","author":"goodfellow","key":"ref23"},{"key":"ref25","article-title":"Ramp: A model for Reliability Aware Microprocessor Design","author":"srinivasan","year":"2003","journal-title":"IBM Research Report"}],"event":{"name":"2021 22nd International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2021,4,7]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2021,4,9]]}},"container-title":["2021 22nd International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424228\/9424248\/09424285.pdf?arnumber=9424285","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:41:23Z","timestamp":1652182883000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9424285\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,7]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/isqed51717.2021.9424285","relation":{},"subject":[],"published":{"date-parts":[[2021,4,7]]}}}