{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T22:31:48Z","timestamp":1765233108328,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,7]]},"DOI":"10.1109\/isqed51717.2021.9424305","type":"proceedings-article","created":{"date-parts":[[2021,5,11]],"date-time":"2021-05-11T00:09:51Z","timestamp":1620691791000},"page":"91-96","source":"Crossref","is-referenced-by-count":15,"title":["Leveraging Deep CNN and Transfer Learning for Side-Channel Attack"],"prefix":"10.1109","author":[{"given":"Amit","family":"Garg","sequence":"first","affiliation":[]},{"given":"Nima","family":"Karimian","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"115","article-title":"A testing methodology for side-channel resistance validation","volume":"7","author":"gilbert goodwill","year":"2011","journal-title":"NIST Non-invasive Attack Testing Workshop"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140247"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2926324"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_38"},{"key":"ref15","article-title":"Batch normalization: Accelerating deep network training by reducing internal covariate shift","author":"ioffe","year":"2015","journal-title":"arXiv preprint arXiv 1502 03167"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i3.148-179"},{"key":"ref17","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2014","journal-title":"arXiv preprint arXiv 1412 6980"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/11894063_14"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.14722\/ndss.2020.24390"},{"key":"ref3","article-title":"Study of deep learning techniques for side-channel analysis and introduction to ascad database","volume":"22","author":"benadjila","year":"2018","journal-title":"ANSSI France & CEA LETI MINATEC Campus France"},{"key":"ref6","first-page":"13","article-title":"Template attacks","author":"chari","year":"2002","journal-title":"9th Intl Workshop on Cryptographic Hardware and Embedded Systems (CHES 2007)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-28632-5_2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317934"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.20"},{"journal-title":"Tesla Autopilot","year":"2021","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85053-3_27"},{"journal-title":"Apple Health","year":"2021","key":"ref1"},{"key":"ref20","first-page":"859","article-title":"Stealthy tracking of autonomous vehicles with cache side channels","author":"luo","year":"2020","journal-title":"29th USENIX Security Symposium USENIX Security 20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00474"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"ref24","first-page":"1929","article-title":"Dropout: a simple way to prevent neural networks from overfitting","volume":"15","author":"srivastava","year":"2014","journal-title":"The Journal of Machine Learning Research"},{"key":"ref23","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"arXiv preprint arXiv 1409 1556"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.308"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"}],"event":{"name":"2021 22nd International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2021,4,7]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2021,4,9]]}},"container-title":["2021 22nd International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424228\/9424248\/09424305.pdf?arnumber=9424305","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:24Z","timestamp":1652197284000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9424305\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,7]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/isqed51717.2021.9424305","relation":{},"subject":[],"published":{"date-parts":[[2021,4,7]]}}}