{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T15:32:17Z","timestamp":1772206337320,"version":"3.50.1"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,7]]},"DOI":"10.1109\/isqed51717.2021.9424316","type":"proceedings-article","created":{"date-parts":[[2021,5,11]],"date-time":"2021-05-11T00:09:51Z","timestamp":1620691791000},"page":"349-354","source":"Crossref","is-referenced-by-count":8,"title":["Fast and Accurate Library Generation Leveraging Deep Learning for OCV Modelling"],"prefix":"10.1109","author":[{"given":"Eunice","family":"Naswali","sequence":"first","affiliation":[]},{"given":"Namhoon","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Pravin","family":"Chandran","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3177540.3177554"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715102"},{"key":"ref12","article-title":"Learning-Based Static Timing Analysis for HighDimensional Correlated On-Chip Variations","author":"bian","year":"2017","journal-title":"Design Automation Conference"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS46596.2019.8965191"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref4","article-title":"Methodology to Close Timing with Hundreds of Multi-mode\/multi-corner Scenarios","author":"matarrese","year":"2016","journal-title":"Silicon Valley"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024899"},{"key":"ref6","article-title":"Analytical Transient Response and Propoagtion Delay Model for Nanoscale CMOS Inverter","author":"wang","year":"2009","journal-title":"International Symposium on Circuits and Systems"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2009.5235938"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-013-1509-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770767"},{"key":"ref2","article-title":"A Unified Multi-corner Multimode Static Timing Analysis Engine","author":"nian","year":"2010","journal-title":"Asia and South Pacific Design Automation Conference"},{"key":"ref1","article-title":"Advanced Node Random Device Variability Modeling and Margining in Characterization and STA","author":"ragheb","year":"2014","journal-title":"Silicon Valley"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2019.8742073"}],"event":{"name":"2021 22nd International Symposium on Quality Electronic Design (ISQED)","location":"Santa Clara, CA, USA","start":{"date-parts":[[2021,4,7]]},"end":{"date-parts":[[2021,4,9]]}},"container-title":["2021 22nd International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424228\/9424248\/09424316.pdf?arnumber=9424316","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:23Z","timestamp":1652197283000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9424316\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,7]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/isqed51717.2021.9424316","relation":{},"subject":[],"published":{"date-parts":[[2021,4,7]]}}}