{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:19:46Z","timestamp":1730276386833,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,7]]},"DOI":"10.1109\/isqed51717.2021.9424337","type":"proceedings-article","created":{"date-parts":[[2021,5,11]],"date-time":"2021-05-11T00:09:51Z","timestamp":1620691791000},"page":"48-53","source":"Crossref","is-referenced-by-count":2,"title":["Cell-Aware Diagnosis of Customer Returns Using Bayesian Inference"],"prefix":"10.1109","author":[{"given":"S.","family":"Mhamdi","sequence":"first","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bosio","sequence":"additional","affiliation":[]},{"given":"A.","family":"Ladhar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.816206"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.9"},{"key":"ref12","article-title":"Diagnosis Resolution Improvement through Learning-Guided Physical Failure Analysis","author":"xue","year":"2016","journal-title":"Proc IEEE International Test Conference"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138758"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035326"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651899"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2020.2992482"},{"key":"ref17","article-title":"A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns","author":"mhamdi","year":"2020","journal-title":"Proc IEEE International Test Conference"},{"key":"ref18","article-title":"Supervised Machine Learning: A Review of Classification Techniques","volume":"31","author":"kotsiantis","year":"2007","journal-title":"Informatica"},{"year":"0","key":"ref19"},{"key":"ref4","article-title":"Effect-Cause Intra-cell Diagnosis at Transistor Level","author":"sun","year":"2013","journal-title":"Proc IEEE International Symposium on Quality Electronic Design"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090808"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2016.7519313"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624799"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.49"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873663"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref1","article-title":"IC Test Solutions for the Automotive Market","author":"pateras","year":"2017","journal-title":"White Paper Mentor Graphics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2010.5419888"}],"event":{"name":"2021 22nd International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2021,4,7]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2021,4,9]]}},"container-title":["2021 22nd International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424228\/9424248\/09424337.pdf?arnumber=9424337","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:22Z","timestamp":1652197282000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9424337\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,7]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/isqed51717.2021.9424337","relation":{},"subject":[],"published":{"date-parts":[[2021,4,7]]}}}