{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:19:48Z","timestamp":1730276388866,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,7]]},"DOI":"10.1109\/isqed51717.2021.9424339","type":"proceedings-article","created":{"date-parts":[[2021,5,11]],"date-time":"2021-05-11T00:09:51Z","timestamp":1620691791000},"page":"450-456","source":"Crossref","is-referenced-by-count":1,"title":["Towards Row Sensitive DRAM Refresh through Retention Awareness"],"prefix":"10.1109","author":[{"given":"Tanmay","family":"Goel","sequence":"first","affiliation":[]},{"given":"Divyansh","family":"Maura","sequence":"additional","affiliation":[]},{"given":"Kaustav","family":"Goswami","sequence":"additional","affiliation":[]},{"given":"Shirshendu","family":"Das","sequence":"additional","affiliation":[]},{"given":"Dip Sankar","family":"Banerjee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2015.58"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2637364.2592000"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LCA.2020.2973991"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1145\/1186736.1186737","article-title":"Spec cpu2006 benchmark descriptions","volume":"34","author":"henning","year":"2006","journal-title":"SIGARCH Comput Archit News"},{"journal-title":"Benchmarking Modern Multiprocessors","year":"2011","author":"bienia","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2014.6974657"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858309"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2017.7968234"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1950365.1950391"},{"article-title":"Sparkk: Quality-scalable approximate storage in dram","year":"2014","author":"lucas","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2366231.2337161"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2749469.2750408"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.13"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3307650.3322231"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2508148.2485928"},{"journal-title":"Tech Rep MT40A2G4 MT40A1G8 MT40A512M16","article-title":"DDR4 SDRAM","year":"2015","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3078505.3078590"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3131848"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.30"}],"event":{"name":"2021 22nd International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2021,4,7]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2021,4,9]]}},"container-title":["2021 22nd International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424228\/9424248\/09424339.pdf?arnumber=9424339","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:23Z","timestamp":1652197283000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9424339\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,7]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/isqed51717.2021.9424339","relation":{},"subject":[],"published":{"date-parts":[[2021,4,7]]}}}