{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,24]],"date-time":"2026-01-24T14:39:42Z","timestamp":1769265582790,"version":"3.49.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,5]],"date-time":"2023-04-05T00:00:00Z","timestamp":1680652800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,5]],"date-time":"2023-04-05T00:00:00Z","timestamp":1680652800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4,5]]},"DOI":"10.1109\/isqed57927.2023.10129334","type":"proceedings-article","created":{"date-parts":[[2023,5,24]],"date-time":"2023-05-24T13:33:09Z","timestamp":1684935189000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["DAGGER: Exploiting Language Semantics for Program Security in Embedded Systems"],"prefix":"10.1109","author":[{"given":"Garret","family":"Cunningham","sequence":"first","affiliation":[{"name":"Ohio University,School of Electrical Engineering and Computer Science,Athens,OH,45701"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Harsha","family":"Chenji","sequence":"additional","affiliation":[{"name":"Ohio University,School of Electrical Engineering and Computer Science,Athens,OH,45701"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Juedes","sequence":"additional","affiliation":[{"name":"Ohio University,School of Electrical Engineering and Computer Science,Athens,OH,45701"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gordon","family":"Stewart","sequence":"additional","affiliation":[{"name":"Ohio University,School of Electrical Engineering and Computer Science,Athens,OH,45701"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Avinash","family":"Karanth","sequence":"additional","affiliation":[{"name":"Ohio University,School of Electrical Engineering and Computer Science,Athens,OH,45701"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1037187.1024404"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2019.2921509"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2008.4658637"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3019772"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2694344.2694368"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2857041"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1086297.1086308"},{"key":"ref1","year":"2013","journal-title":"&#x201C;CVE-2014-0160 &#x201D; Available from MITRE CVE-ID CVE-2014-0160"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2012.6339273"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2007.346205"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3352460.3358274"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3352460.3358274"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD51958.2021.9643538"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2663716.2663755"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2133375.2133377"},{"key":"ref4","first-page":"807","article-title":"{PHMon}: A programmable hardware monitor and its security use cases","author":"delshadtehrani","year":"2020","journal-title":"29th USENIX Security Symposium (USENIX Security 20)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2018.8297409"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2694344.2694383"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LCA.2017.2784416"}],"event":{"name":"2023 24th International Symposium on Quality Electronic Design (ISQED)","location":"San Francisco, CA, USA","start":{"date-parts":[[2023,4,5]]},"end":{"date-parts":[[2023,4,7]]}},"container-title":["2023 24th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10129281\/10129282\/10129334.pdf?arnumber=10129334","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T13:55:20Z","timestamp":1686578120000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10129334\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4,5]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/isqed57927.2023.10129334","relation":{},"subject":[],"published":{"date-parts":[[2023,4,5]]}}}