{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T11:01:14Z","timestamp":1776942074134,"version":"3.51.4"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,5]],"date-time":"2023-04-05T00:00:00Z","timestamp":1680652800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,5]],"date-time":"2023-04-05T00:00:00Z","timestamp":1680652800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4,5]]},"DOI":"10.1109\/isqed57927.2023.10129339","type":"proceedings-article","created":{"date-parts":[[2023,5,24]],"date-time":"2023-05-24T13:33:09Z","timestamp":1684935189000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Application of Machine Learning for Quality Risk Factor Analysis of Electronic Assemblies"],"prefix":"10.1109","author":[{"given":"Brendan","family":"Reidy","sequence":"first","affiliation":[{"name":"University of South Carolina,Department of Computer Science and Engineering,Columbia,SC,USA,29208"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Duggan","sequence":"additional","affiliation":[{"name":"University of South Carolina,Department of Computer Science and Engineering,Columbia,SC,USA,29208"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bernard","family":"Glasauer","sequence":"additional","affiliation":[{"name":"Juniper Networks,Component Engineering,Sunnyvale,CA,USA,94089"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peng","family":"Su","sequence":"additional","affiliation":[{"name":"Juniper Networks,Component Engineering,Sunnyvale,CA,USA,94089"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ramtin","family":"Zand","sequence":"additional","affiliation":[{"name":"University of South Carolina,Department of Computer Science and Engineering,Columbia,SC,USA,29208"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPCON.2018.8748670"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-13-6447-1_10"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/MVA.2019.8757928"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MVIP49855.2020.9187485"},{"key":"ref20","first-page":"1929","article-title":"Dropout: A simple way to prevent neural networks from overfitting","volume":"15","author":"srivastava","year":"2014","journal-title":"Journal of Machine Learning Research"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IMPACT.2018.8625828"},{"key":"ref10","first-page":"365","author":"chen","year":"2021","journal-title":"Machine Learning Based Acceleration Method for Ordered Escape Routing"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1108\/SSMT-10-2018-0036"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/app8040582"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/nbt1206-1565"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CCET52649.2021.9544356"},{"key":"ref19","first-page":"2825","article-title":"Scikit-learn: Machine learning in Python","volume":"12","author":"pedregosa","year":"2011","journal-title":"Journal of Machine Learning Research"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1587\/elex.17.20190737"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-016-0775-1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IAC.2016.7905706"},{"key":"ref4","first-page":"1","article-title":"Trash or Treasure? Machine-learning based PCB layout anomaly detection with AnoPCB","author":"franke","year":"2021","journal-title":"SMACD \/ PRIME 2021 International Conference on SMACD and 16th Conference on PRIME dummydata"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-014-0505-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-010-0444-x"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.3390\/electronics9081243","article-title":"Effective pcb decoupling optimization by combining an iterative genetic algorithm and machine learning","volume":"9","author":"cecchetti","year":"2020","journal-title":"Electronics"}],"event":{"name":"2023 24th International Symposium on Quality Electronic Design (ISQED)","location":"San Francisco, CA, USA","start":{"date-parts":[[2023,4,5]]},"end":{"date-parts":[[2023,4,7]]}},"container-title":["2023 24th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10129281\/10129282\/10129339.pdf?arnumber=10129339","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T13:55:05Z","timestamp":1686578105000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10129339\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/isqed57927.2023.10129339","relation":{},"subject":[],"published":{"date-parts":[[2023,4,5]]}}}