{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T16:28:25Z","timestamp":1784910505490,"version":"3.55.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,5]],"date-time":"2023-04-05T00:00:00Z","timestamp":1680652800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,5]],"date-time":"2023-04-05T00:00:00Z","timestamp":1680652800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100009224","name":"Advanced Research Projects Agency","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100009224","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4,5]]},"DOI":"10.1109\/isqed57927.2023.10129349","type":"proceedings-article","created":{"date-parts":[[2023,5,24]],"date-time":"2023-05-24T17:33:09Z","timestamp":1684949589000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["A Low-overhead PUF-based Secure Scan Design"],"prefix":"10.1109","author":[{"given":"Wei","family":"Zhou","sequence":"first","affiliation":[{"name":"Harbin Institute of Technology (Shenzhen),School of Electronic and Information Engineering,Guangdong,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Aijiao","family":"Cui","sequence":"additional","affiliation":[{"name":"Harbin Institute of Technology (Shenzhen),School of Electronic and Information Engineering,Guangdong,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cassi","family":"Chen","sequence":"additional","affiliation":[{"name":"University of California,Berkeley,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gang","family":"Qu","sequence":"additional","affiliation":[{"name":"Univ. of Maryland,Dept. of Electrical and Computer Engineering and Institute of Systems Research,College Park,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2017.7968248"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70215"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS.2012.6419108"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2772817"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2019.2903387"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/NVMTS.2013.6632855"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-7720-x"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2013.47"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS48691.2020.9107566"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2018.00030"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2013.6811855"},{"key":"ref1","first-page":"339","article-title":"Scan-based side-channel attack on dedicated hardware implementations of data encryption standard","author":"bo","year":"2004","journal-title":"Proc of the Int Test Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.89"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.85"},{"key":"ref19","first-page":"715","article-title":"A low-overhead PUF based on parallel scan design","author":"wang","year":"2017","journal-title":"Asia South Pacific Design Autom Conf (ASP-DAC)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7538900"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2018.00035"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TrustCom\/BigDataSE.2018.00208"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.2979458"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.10.011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E93.A.2481"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2613847"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2089071"}],"event":{"name":"2023 24th International Symposium on Quality Electronic Design (ISQED)","location":"San Francisco, CA, USA","start":{"date-parts":[[2023,4,5]]},"end":{"date-parts":[[2023,4,7]]}},"container-title":["2023 24th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10129281\/10129282\/10129349.pdf?arnumber=10129349","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:55:07Z","timestamp":1686592507000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10129349\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4,5]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/isqed57927.2023.10129349","relation":{},"subject":[],"published":{"date-parts":[[2023,4,5]]}}}