{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:21:07Z","timestamp":1730276467268,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,3]],"date-time":"2024-04-03T00:00:00Z","timestamp":1712102400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,3]],"date-time":"2024-04-03T00:00:00Z","timestamp":1712102400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007688","name":"American University of Beirut","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007688","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,3]]},"DOI":"10.1109\/isqed60706.2024.10528754","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:18Z","timestamp":1715880078000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["nvXNOR Design with Enhanced Store Capability for BNN Applications"],"prefix":"10.1109","author":[{"given":"Zeinab","family":"Soueidan","sequence":"first","affiliation":[{"name":"American University of Beirut,Maroun Semaan Faculty of Engineering and Architeture,ECE Dept.,Beirut,Lebanon,1107 202"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rouwaida","family":"Kanj","sequence":"additional","affiliation":[{"name":"American University of Beirut,Maroun Semaan Faculty of Engineering and Architeture,ECE Dept.,Beirut,Lebanon,1107 202"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.5555\/2999134.2999257"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2012.2205597"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.5573\/IEIESPC.2015.4.1.035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3115\/v1\/p14-1129"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963616"},{"key":"ref6","article-title":"Binaryconnect: Training deep neural networks with binary weights during propagations","volume":"28","author":"Courbariaux","year":"2015","journal-title":"Advances in neural information processing systems"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_32"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465935"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662392"},{"volume-title":"Omitted for blind review","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2724024"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860604"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614664"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7926952"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2013.6582090"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409648"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2192661"},{"volume-title":"Predictive echnology models (ptm)","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2210856"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228562"},{"volume-title":"Learning multiple layers of features from tiny images","year":"2009","author":"Krizhevsky","key":"ref21"},{"volume-title":"Larq","key":"ref22"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2017.09.046"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.37099\/mtu.dc.etdr\/487"}],"event":{"name":"2024 25th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2024,4,3]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2024,4,5]]}},"container-title":["2024 25th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10528356\/10528364\/10528754.pdf?arnumber=10528754","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T04:56:15Z","timestamp":1715921775000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10528754\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,3]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/isqed60706.2024.10528754","relation":{},"subject":[],"published":{"date-parts":[[2024,4,3]]}}}