{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:55:38Z","timestamp":1740102938428,"version":"3.37.3"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,3]],"date-time":"2024-04-03T00:00:00Z","timestamp":1712102400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,3]],"date-time":"2024-04-03T00:00:00Z","timestamp":1712102400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100009950","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100009950","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,3]]},"DOI":"10.1109\/isqed60706.2024.10528774","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:18Z","timestamp":1715880078000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Composite Sub-surface Model for RF GaN-HEMTs"],"prefix":"10.1109","author":[{"given":"X.","family":"Zhou","sequence":"first","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.","family":"Yang","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. B.","family":"Chiah","sequence":"additional","affiliation":[{"name":"New Silicon Corporation Pte Ltd,Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2024 25th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2024,4,3]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2024,4,5]]}},"container-title":["2024 25th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10528356\/10528364\/10528774.pdf?arnumber=10528774","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T17:23:15Z","timestamp":1715966595000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10528774\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,3]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/isqed60706.2024.10528774","relation":{},"subject":[],"published":{"date-parts":[[2024,4,3]]}}}