{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T04:08:26Z","timestamp":1748750906679,"version":"3.41.0"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T00:00:00Z","timestamp":1745366400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T00:00:00Z","timestamp":1745366400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","award":["RGPIN-2021-02778"],"award-info":[{"award-number":["RGPIN-2021-02778"]}],"id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,4,23]]},"DOI":"10.1109\/isqed65160.2025.11014347","type":"proceedings-article","created":{"date-parts":[[2025,5,30]],"date-time":"2025-05-30T17:43:30Z","timestamp":1748627010000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Behavioral Model of Charge-Trap Transistors for Neuromorphic Systems"],"prefix":"10.1109","author":[{"given":"Ataollah Saeed","family":"Monir","sequence":"first","affiliation":[{"name":"McGill University,Electrical and Computer Engineering Department,Montreal,QC,Canada"}]},{"given":"Navid","family":"Rezazadeh","sequence":"additional","affiliation":[{"name":"Blumind,Ottawa,ON,Canada"}]},{"given":"John","family":"Gosson","sequence":"additional","affiliation":[{"name":"Blumind,Ottawa,ON,Canada"}]},{"given":"Boris","family":"Vaisband","sequence":"additional","affiliation":[{"name":"University of California,Electrical Engineering and Computer Science Department,Irvine,CA,United States"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.823863"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112816"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813522"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2933484"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2504952"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2633490"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2859237"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2023.3244775"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM45625.2022.10019527"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067521"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3583781.3590325"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3583781.3590230"},{"volume-title":"Cadence Virtuoso","year":"2022","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3028534"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EPEPS.2017.8329743"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3407651"},{"key":"ref17","article-title":"Scalable and Analog Neuromorphic Computing Systems","volume-title":"UCLA","author":"Wan","year":"2020"},{"volume-title":"Bias Temperature Instability for Devices and Circuits","year":"2013","author":"Grasser","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2002.996615"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.845880"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2016954"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2919871"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.897532"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131624"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.5027856"}],"event":{"name":"2025 26th International Symposium on Quality Electronic Design (ISQED)","start":{"date-parts":[[2025,4,23]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2025,4,25]]}},"container-title":["2025 26th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11014297\/11014302\/11014347.pdf?arnumber=11014347","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,31]],"date-time":"2025-05-31T04:59:54Z","timestamp":1748667594000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11014347\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,23]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/isqed65160.2025.11014347","relation":{},"subject":[],"published":{"date-parts":[[2025,4,23]]}}}