{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T05:03:57Z","timestamp":1780031037321,"version":"3.53.1"},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T00:00:00Z","timestamp":1775606400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T00:00:00Z","timestamp":1775606400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,8]]},"DOI":"10.1109\/isqed69900.2026.11534785","type":"proceedings-article","created":{"date-parts":[[2026,5,28]],"date-time":"2026-05-28T22:26:58Z","timestamp":1780007218000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Design Space Exploration of Soft-Error-Tolerant SRAMs for Compute-in-Memory Accelerators"],"prefix":"10.1109","author":[{"given":"Jinane","family":"Bazzi","sequence":"first","affiliation":[{"name":"King Abdullah University of Science and Technology (KAUST),CEMSE Division,Thuwal,Saudi Arabia,23955"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"R.","family":"Jamil","sequence":"additional","affiliation":[{"name":"American University of Beirut,ECE Department,Lebanon"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"H.","family":"Masri","sequence":"additional","affiliation":[{"name":"American University of Beirut,ECE Department,Lebanon"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"A.","family":"Alayan","sequence":"additional","affiliation":[{"name":"American University of Beirut,ECE Department,Lebanon"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rouwaida","family":"Kanj","sequence":"additional","affiliation":[{"name":"American University of Beirut,ECE Department,Lebanon"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mohammed E.","family":"Fouda","sequence":"additional","affiliation":[{"name":"Compumacy for Artificial Intelligence Solutions,Cairo,Egypt"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ahmed","family":"Eltawil","sequence":"additional","affiliation":[{"name":"King Abdullah University of Science and Technology (KAUST),CEMSE Division,Thuwal,Saudi Arabia,23955"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3213542"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS58744.2024.10558662"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS56072.2025.11044064"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3355944"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.912983"},{"key":"ref6","article-title":"First evaluation of neutron induced single events effect on the cms barrel muon electronics","volume-title":"CERN-CMS-NOTE-2000024","author":"Agosteo","year":"2000"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2304658"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2645282"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/NAS.2018.8515692"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00130"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12040853"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2642198"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310398"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.13182\/xyz-47418"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL.2017.8190065"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046169"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830438"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731715"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731621"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/app132111914"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365932"},{"key":"ref22","volume-title":"Asap: Arizona state predictive pdk","author":"Clark","year":"2025"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203889"},{"key":"ref24","volume-title":"HSPICE Reference Manual: Commands and Control Options"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3031290"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3070856"},{"key":"ref27","first-page":"1","article-title":"Noise injection adaption: End-to-end reram crossbar non-ideal effect adaption for neural network mapping","volume-title":"Proceedings of the 56th Annual Design Automation Conference 2019","author":"He"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.net.2025.103785"}],"event":{"name":"2026 27th International Symposium on Quality Electronic Design (ISQED)","location":"San Francisco, CA, USA","start":{"date-parts":[[2026,4,8]]},"end":{"date-parts":[[2026,4,10]]}},"container-title":["2026 27th International Symposium on Quality Electronic Design (ISQED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11534651\/11534652\/11534785.pdf?arnumber=11534785","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T04:26:27Z","timestamp":1780028787000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11534785\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,8]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/isqed69900.2026.11534785","relation":{},"subject":[],"published":{"date-parts":[[2026,4,8]]}}}