{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T22:45:12Z","timestamp":1725403512784},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006]]},"DOI":"10.1109\/isscc.2006.1696260","type":"proceedings-article","created":{"date-parts":[[2006,9,22]],"date-time":"2006-09-22T17:01:13Z","timestamp":1158944473000},"page":"2014-2023","source":"Crossref","is-referenced-by-count":1,"title":["A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction"],"prefix":"10.1109","author":[{"given":"M.F.","family":"Snoeij","sequence":"first","affiliation":[]},{"given":"A.","family":"Theuwissen","sequence":"additional","affiliation":[]},{"given":"K.","family":"Makinwa","sequence":"additional","affiliation":[]},{"given":"J.H.","family":"Huijsing","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"76","article-title":"APS Column Fixed Pattern Noise Reduction","author":"anaxagoras","year":"2005","journal-title":"IEEE Workshop on CCDs and Advanced Image Sensors"},{"key":"ref3","first-page":"218","article-title":"SXGA Pinned Photodiode CMOS Image Sensor in $0.35\\mu {\\rm m}$ Technology","author":"findlater","year":"2003","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref5","first-page":"6162","article-title":"A 1.8V $3.2\\mu{\\rm W}$ Comparator for Use in a CMOS Imager Column-Level Single-Slope ADC","author":"snoeij","year":"2005","journal-title":"IEEE ISCAS"},{"key":"ref2","first-page":"108","article-title":"A 60 mW 10b CMOS Image Sensor with Column-to-Column FPN Reduction","author":"sugiki","year":"2000","journal-title":"ISSCC Dig Tech Papers"},{"key":"ref1","article-title":"CMOS Pixel Device Physics","author":"sackett","year":"2005","journal-title":"2005 IEEE ISSCC Circuit Design Forum Characterization of Solid-State Image Sensors"}],"event":{"name":"2006 IEEE International Solid State Circuits Conference","start":{"date-parts":[[2006,2,6]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2006,2,9]]}},"container-title":["2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/11149\/35738\/01696260.pdf?arnumber=1696260","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,5,27]],"date-time":"2021-05-27T00:26:14Z","timestamp":1622075174000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1696260\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/isscc.2006.1696260","relation":{},"subject":[],"published":{"date-parts":[[2006]]}}}